Reservations

Training

Operation of High-resolution, Low-voltage Scanning Electron Microscope
(FEI Verios 460 XHR SEM)

the Verios 460 is capable of sub-nanometer characterization of materials. Super high contrast and image quality can be preserved by integrated beam decelerator, which maintains primary beam coherency, but a low landing energy. Elstar Schottky monochromated (UC) field emission gun (FEG) column provides sub-nanometer resolution (0.6 - 0.7nm) performance from 1 to 30 kV
integrated beam deceleration allowing beam landing energies as low as 20 eV piezo-enabled 100x100 mm 5-axis motorized eucentric stage
advanced detectors including Everhart-Thornley SED, in-column & below-the-lens detectors, FEI SmartScan and Oxford energy dispersive X-ray spectrometer (EDS) system for elemental mapping and analysis

Please be aware that this course has the following pre-requisite (or equivalent experience): "Operation of an environmental scanning electron microscope (Quanta 200 FE-ESEM) ". Questions about your qualification to enroll in this course should be directed to Nan Yao, director of the Imaging and Analysis Center. Please do not enroll in this course unless you are certain you have met the pre-requisite requirements. Thank you!